Application Notes


Data Storage List View


Atomic Force Microscopy and Raman Spectroscopy


 


System Configuration:

-   Upright
-   Inverted
-   Side Illumination

 

System Compatibility:
The Labram HR spectrometer (by Horiba JY) is compatible with the following AFM models:

-   XE-70
-   XE-100
-   XE-120
-   XE-150
-   XE-Bio
-   XE-NSOM

 

The Benefits:
Tip-enhanced Raman spectroscopy (TERS) when combined with an atomic force microscope provides information about the intermolecular vibrations of the sample while providing 3 dimension topographic information.  One of the main advantages for using an AFM-nano Raman system lies in the increased Raman resolution available with the TERS technique over micro Raman measurements.  

Such a  technique can offer unprecedented resolution that has become a very useful tool for biologists and surface  or material scientists, as well as, for nano-characterization in the semiconductor industry.

   

 


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Atomic Force Microscopy AND Raman Spectroscopy

(AFM/Raman)

 

1. The basic parameters of the AFM head are defined with the Park Systems software

 

2. The Labspec software takes the control of the AFM-Raman instrument to run AFM image and Raman spectra simultaneously

 

Side illumination Configuration of the AFM-Raman system shown with the XE-100 with Optional Optical Head and the HJY Labram HR.

Publications Combining XE-AFM/HJY Raman Spectroscopy

Tip enhanced Raman spectroscopy on azobenzene thiol self-assembledmonolayers on Au(111), Gennaro Picardi, Marc Chaigneau, Razvigor Ossikovski, Christophe Licitrab and Guillame Delapierreb, Journal of Raman Spectroscopy, 2009, 40(10) p 1407-1412

Polarization Properties of Oblique Incidence Scanning Tunneling Microscopy–Tip-Enhanced Raman Spectroscopy, Gennaro Picardi, Quang Nguyen, Razvigor Ossikovski, and Joachim Schreiber, Applied Spectroscopy, 61(12), 2007 p 1301-1305




Atomic Force Microscope
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